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Advances in x-ray diffractometry and x-ray spectrography: a volume of fifteen selected reprints from philips laboratories Irvington-on Hudson, New York, USA

Bibliographic Details
Other Authors: Parrish, william., ed
Format: Printed Book
Language:English
Published: Eindhoven Centrex Publishing Cp. 1962
Subjects:

PHY

Holdings details from PHY
Call Number: 548.83 PAR
Copy Live Status Unavailable