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| LEADER |
00647nam a22001457a 4500 |
| 005 |
20200810152103.0 |
| 008 |
100206t xxu||||| |||| 00| 0 eng d |
| 082 |
|
|
|a 548.83
|b PAR
|
| 245 |
|
|
|a Advances in x-ray diffractometry and x-ray spectrography:
|b a volume of fifteen selected reprints from philips laboratories Irvington-on Hudson, New York, USA
|
| 653 |
|
|
|a X-ray diffractometry
|a X-ray spectrography
|
| 700 |
|
|
|a Parrish, william., ed.
|9 3529
|
| 942 |
|
|
|c BK
|6 _
|
| 260 |
|
|
|a Eindhoven
|b Centrex Publishing Cp.
|c 1962
|
| 999 |
|
|
|c 211866
|d 211866
|
| 952 |
|
|
|0 0
|1 0
|2 ddc
|4 0
|6 54883_PAR
|7 0
|9 270061
|a PHY
|b PHY
|d 2010-02-06
|o 548.83 PAR
|p PHY001193
|r 2010-02-06
|w 2010-02-06
|y BK
|