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Handbook of instrumentation and techniques for semiconductor nanostructure characterization

Detalles Bibliográficos
Autor Principal:	Haight, Richard; ed (ed. by)
Outros autores:	Ross, Frances M, Hannon, James B
Formato:	Printed Book
Idioma:	English
Publicado:	Singapore World Scientific publishing 2012
Series:	World scientific series in materials and energy
Subjects:	Semiconductors Nanostructures - Electronmicroscopy x-ray diffraction Scanning microscopy

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