Handbook of instrumentation and techniques for semiconductor nanostructure characterization

Bibliographic Details
Main Author: Haight, Richard; ed (ed. by)
Other Authors: Ross, Frances M, Hannon, James B
Format: Printed Book
Language:English
Published: Singapore World Scientific publishing 2012
Series:World scientific series in materials and energy
Subjects:
Semiconductors
Nanostructures - Electronmicroscopy
x-ray diffraction
Scanning microscopy

UL

Holdings details from UL
Call Number: 621.382:681.7 HAI.1 R
621.382:681.7 HAI.2 R
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