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Handbook of instrumentation and techniques for semiconductor nanostructure characterization

Bibliografiska uppgifter
Huvudupphovsman:	Haight, Richard; ed (ed. by)
Övriga upphovsmän:	Ross, Frances M, Hannon, James B
Materialtyp:	Printed Book
Språk:	English
Publicerad:	Singapore World Scientific publishing 2012
Serie:	World scientific series in materials and energy
Ämnen:	Semiconductors Nanostructures - Electronmicroscopy x-ray diffraction Scanning microscopy

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