Chargement en cours...
Handbook of instrumentation and techniques for semiconductor nanostructure characterization
| Auteur principal: | Haight, Richard; ed (ed. by) |
|---|---|
| Autres auteurs: | Ross, Frances M, Hannon, James B |
| Format: | Printed Book |
| Langue: | English |
| Publié: |
Singapore
World Scientific publishing
2012
|
| Collection: | World scientific series in materials and energy
|
| Sujets: |
Documents similaires
-
Techniques in microscopy and cell biology
par: Sharma, V K
Publié: (1991) -
X-ray diffraction procedures for polycrystalline and amorphous materials
par: Klug, Harold P.
Publié: (1974) -
Scanning electron microscopy and x-ray microanalysis analytical chemistry by open learning
par: Lawes, Grahame
Publié: (2008) -
SCANNING ELECTRON MICROSCOPY AND X/RAY MICROANALYSIS
par: LAWES GRAHAME
Publié: (2008) -
Strain and dislocation gradients from diffraction spatially-resolved local structure and defects
par: Barabash, Rozaliya; ed
Publié: (2014)