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System-on-chip test architectures: nanometer design for testability
| Huvudupphovsman: | Wang, Laung-Terng (ed. by) |
|---|---|
| Övriga upphovsmän: | Stround, Charles E. Touba, Nur A. |
| Materialtyp: | Printed Book |
| Språk: | English |
| Publicerad: |
Boston
Morgan Kaufmann
2008
|
| Ämnen: |
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