Dangos 1 - 2 canlyniadau o 2 ar gyfer chwilio 'Wang, Laung-Terng', amser ymholiad: 0.01e Mireinio'r Canlyniadau
  1. 1
    System-on-chip test architectures: nanometer design for testability
    gan Wang, Laung-Terng
    Cyhoeddwyd 2008
    Printed Book
  2. 2
    VLSI test principles and architectures: design for testability
    gan Wang, laung-Terng [ed.]
    Cyhoeddwyd 2006
    Printed Book
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