Showing 1 - 2 results of 2 for search 'Wang, Laung-Terng', 查詢時間: 0.01s Refine Results
  1. 1
    System-on-chip test architectures: nanometer design for testability
    由 Wang, Laung-Terng
    出版 2008
    Printed Book
  2. 2
    VLSI test principles and architectures: design for testability
    由 Wang, laung-Terng [ed.]
    出版 2006
    Printed Book
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