Erakusten 1 - 2 emaitzak -- 2 bilaketa honetara 'Wang, Laung-Terng', Bilaketaren denbora: 0,01s Findu emaitzak
  1. 1
    System-on-chip test architectures: nanometer design for testability
    nork Wang, Laung-Terng
    Argitaratua 2008
    Printed Book
  2. 2
    VLSI test principles and architectures: design for testability
    nork Wang, laung-Terng [ed.]
    Argitaratua 2006
    Printed Book
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