Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

Gelijkaardige items

• Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
  door: Rupa, R. Pai
  Gepubliceerd in: (2004)
• Intermetallic semiconducting films
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• Semiconducting Transparent Thin Films
  door: Hartnagel,H L
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• Studies on thermoelectric semiconducting oxide materials
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  door: Heeger, Alan J
  Gepubliceerd in: (2010)