Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

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Bibliographic Details
Main Author: Rupa R. Pai
Other Authors: Sudha Kartha, C.
Format: Printed Book
Language:English
Published: Kochi Department of Physics, CUSAT 2004
Subjects:
Semiconducting thin films

UL

Holdings details from UL
Call Number: 539.216.2 RUP
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