Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

समान संसाधन

• Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
  द्वारा: Rupa, R. Pai
  प्रकाशित: (2004)
• Intermetallic semiconducting films
  द्वारा: Wieder, H H
  प्रकाशित: (1970)
• Semiconducting Transparent Thin Films
  द्वारा: Hartnagel,H L
  प्रकाशित: (1995)
• Studies on thermoelectric semiconducting oxide materials
  द्वारा: Ramachandran T
• Semiconducting and metallic polymers
  द्वारा: Heeger, Alan J
  प्रकाशित: (2010)