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Physical aspects of electron microscopy and microbeam analysis /
| Other Authors: | |
|---|---|
| Format: | Printed Book |
| Language: | English |
| LEADER | 00418nam a2200109Ia 4500 | ||
|---|---|---|---|
| 008 | 150624b xxu||||| |||| 00| 0 eng d | ||
| 082 | |a 535.3325 | ||
| 245 | |a Physical aspects of electron microscopy and microbeam analysis / | ||
| 700 | |a Siegel, Benjamin M. |e editor. | ||
| 942 | |c BK | ||
| 999 | |c 17754 |d 17754 | ||
| 952 | |0 0 |1 0 |4 0 |6 535_332500000000000_SIE_P |7 0 |9 17753 |a UL |b UL |c ST1 |d 1998-09-07 |l 0 |o 535.3325 SIE/P |p 27023 |r 2012-10-27 |w 2012-10-27 |y BK | ||