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Applied logistic regression

Bibliographic Details
Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley, Sturdivant, Rodney X.
Format: Printed Book
Published: New Jersey Johnn Wiley & Sons 2013
Edition:3rd.
Subjects:

Kannur University

Holdings details from Kannur University
Call Number: 519.536 HOS/A
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