लोड हो रहा है...
Non-destructive evaluation of ion implanted semiconducfor thin films using photothermal deflection spectrosco
मुख्य लेखक: | Paulraj, M. |
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स्वरूप: | Ph.D Thesis |
भाषा: | English |
प्रकाशित: |
Kochi
Dept.of Physics - CUSAT
2004
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विषय: |
समान संसाधन
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Photoacoustic and photothermal deflection studies on certain selected photonic materials
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Photothermal beam deflection for non-destructive evaluation of semiconductor thin films (Thesis)
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Photothermal deflection spectroscopy and some of its applications
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