Nalaganje...
Non-destructive evaluation of ion implanted semiconducfor thin films using photothermal deflection spectrosco
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| Format: | Ph.D Thesis |
| Jezik: | English |
| Izdano: |
Kochi
Dept.of Physics - CUSAT
2004
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| Teme: |
| Opis knjige/članka: | Thesis (Ph.D),CUSAT, 2004 Guide : Vijayakumar, K.P. |
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| Fizični opis: | 256p. |