Cargando...
Physical aspects of electron microscopy and microbeam analysis
| Autor Principal: | Siegel, Benyamin M. |
|---|---|
| Outros autores: | Beaman, Donald R. |
| Formato: | Printed Book |
| Idioma: | English |
| Publicado: |
New york
John wiley
1975
|
| Subjects: |
Títulos similares
-
Quantitative microbeam analysis
por: Fitzgerald, A G, Ed., et al
Publicado: (1993) -
Electron microscopy and analysis
por: Goodhew, Peter J, et al
Publicado: (2001) -
Introduction to electron microscopy
por: Wischnitzer, Saul
Publicado: (1970) -
Principles and practice of electron microscopy
por: Watt, Ian M
Publicado: (1989) -
Electron microscopy methods and protocols
por: Hajibagheri, M A Nasser, Ed
Publicado: (1999)