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Thin film analysis by xray scattering

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書目詳細資料
主要作者:	Birkholz, Mario
格式:	電子書
語言:	English
出版:	Wiley 2006
主題:	Materials Characterization
在線閱讀:	http://onlinelibrary.wiley.com/book/10.1002/3527607595

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