Thin film analysis by xray scattering

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Bibliographic Details
Main Author: Birkholz, Mario
Format: eBook
Language:English
Published: Wiley 2006
Subjects:
Materials Characterization
Online Access:http://onlinelibrary.wiley.com/book/10.1002/3527607595

Internet

http://onlinelibrary.wiley.com/book/10.1002/3527607595

UL

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