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Thin film analysis by xray scattering

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Bibliografiska uppgifter
Huvudupphovsman:	Birkholz, Mario
Materialtyp:	E-bok
Språk:	English
Publicerad:	Wiley 2006
Ämnen:	Materials Characterization
Länkar:	http://onlinelibrary.wiley.com/book/10.1002/3527607595

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