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Thin film analysis by xray scattering

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Detalhes bibliográficos
Autor principal:	Birkholz, Mario
Formato:	livro electrónico
Idioma:	English
Publicado em:	Wiley 2006
Assuntos:	Materials Characterization
Acesso em linha:	http://onlinelibrary.wiley.com/book/10.1002/3527607595

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