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Thin film analysis by xray scattering

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Bibliografski detalji
Glavni autor:	Birkholz, Mario
Format:	e-knjiga
Jezik:	English
Izdano:	Wiley 2006
Teme:	Materials Characterization
Online pristup:	http://onlinelibrary.wiley.com/book/10.1002/3527607595

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