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Thin film analysis by xray scattering

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Sonraí Bibleagrafaíochta
Príomhúdar:	Birkholz, Mario
Formáid:	ríomhLeabhar
Teanga:	English
Foilsithe:	Wiley 2006
Ábhair:	Materials Characterization
Rochtain Ar Líne:	http://onlinelibrary.wiley.com/book/10.1002/3527607595

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