Thin film analysis by xray scattering

Détails bibliographiques
Auteur principal:	Birkholz, Mario
Format:	eBook
Langue:	English
Publié:	Wiley 2006
Sujets:	Materials Characterization
Accès en ligne:	http://onlinelibrary.wiley.com/book/10.1002/3527607595

Nanomaterials and nanocomposites : synthesis, properties, characterization techniques, and applications /
par: Goyal, Rajendra Kumar
Publié: (2018)

Chargement en cours...

Synthesis Characterization and Properties of Glass free Vanadate based Ceramics for Microwave Circuit Applications
par: Divya P N

Chargement en cours...

Polymer characterization
par: Campbell, D
Publié: (1989)

Chargement en cours...

Characterization of solid polymers
Publié: (1994)

Chargement en cours...

Characterization of highly cross- linked polymers
Publié: (1984)

Chargement en cours...

Polymer characterization: physical techniques
par: Campbell, D; Author, et autres
Publié: (1989)

Chargement en cours...

Characterization of Avocado(Persea americana Mill)
par: Anu Ann Augustine
Publié: (2020)

Chargement en cours...

Magnetic thin films
par: Soohoo, Ronald F.
Publié: (1965)

Chargement en cours...

Thin Film Materials Stress, Defect Formation and Surface Evolution
par: Freund, L. B.
Publié: (2010)

Chargement en cours...

Nanostructured thin films and surfaces /
Publié: (2010)

Chargement en cours...

Physics of nonmetallic thin films /
Publié: (1976)

Chargement en cours...

Thermal analysis in polymer characterization
Publié: (1981)

Chargement en cours...

Thermal characterization of polymeric materials
Publié: (1981)

Chargement en cours...

Applied polymer analysis and characterization : recent developments in techniques, instrumentation, problem solving
Publié: (1987)

Chargement en cours...

Nanostructured thin films and surfaces
par: Kumar, Challa S.S.R; ed
Publié: (2010)

Chargement en cours...

Thin ferromagnetic films
par: Prutton, M.
Publié: (1964)

Chargement en cours...

Characterization of Powder Surfaces with Special Reference to Pigments and Fellers
par: Parafitt, G.D
Publié: (1976)

Chargement en cours...

The electrical characterization of semiconductors : measurement of minority carrier properties
par: Orton, J. W.
Publié: (1990)

Chargement en cours...

Structura characterization of some peptides based on Anthranilic acid and a sulfonamide by Nuclear magnetic Resonance spectros copy Project Report
par: Rajamohan P R
Publié: (2005)

Chargement en cours...

Characterization of Anticancer active copper complexes formed by pyrrolidine dithiocarboxylic acid ProjectReport
par: Suja Subramanian
Publié: (2009)

Chargement en cours...

Isolation and characterization of glycosaminoglycans and a study of its bioactive potential in two commercially important species of cephalopods, Loligo duvauceli and Sepia pharaonis
par: Manjusha K.P
Publié: (2011)

Chargement en cours...

Some characterizations of pareto and related populations
par: Hitha, N
Publié: (1991)

Chargement en cours...

Magnetic heterostructures
par: Zabel,Hartmut
Publié: (2008)

Chargement en cours...

THE CHARACTERIZATION OF ORGANIC COMPOUNDS
par: MCELVAIN SAMUEL M
Publié: (1945)

Chargement en cours...

REACTIONS AND CHARACTERIZATION OF SOLIDS
par: SANDRA E DANN
Publié: (2000)

Chargement en cours...

REACTIONS AND CHARACTERIZATION OF SOLIDS
par: SANDRA E DANN
Publié: (2000)

Chargement en cours...

REACTIONS AND CHARACTERIZATION OF SOLIDS
par: SANDRA E DANN
Publié: (2000)

Chargement en cours...

Semiconducting transparent thin films
par: Hartnagel, H. L. [...et al]
Publié: (1995)

Chargement en cours...

Semiconducting transparent thin films
par: Hartnagel, H. L. [...et al]
Publié: (1995)

Chargement en cours...

X'ray microscopy /
par: Cosslett, Ve
Publié: (1960)

Chargement en cours...

Introduction to Xray crystallography
par: Woolfson, M M
Publié: (1980)

Chargement en cours...

Proceedings of the international workshop on crystal growth and characterization of advanced materials: january 9-13, 2006
par: Kumar, J.
Publié: (2006)

Chargement en cours...

Optical characterization of solids
par: Dragoman, Daniela

Thin film analysis by xray scattering

Documents similaires

Documents similaires