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Thin film analysis by xray scattering

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Dades bibliogràfiques
Autor principal:	Birkholz, Mario
Format:	eBook
Idioma:	English
Publicat:	Wiley 2006
Matèries:	Materials Characterization
Accés en línia:	http://onlinelibrary.wiley.com/book/10.1002/3527607595

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