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Thin film analysis by xray scattering
| Main Author: | |
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| Format: | eBook |
| Language: | English |
| Published: |
Wiley
2006
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| Subjects: | |
| Online Access: | http://onlinelibrary.wiley.com/book/10.1002/3527607595 |
| LEADER | 00531 a2200157 4500 | ||
|---|---|---|---|
| 005 | 20151026133250.0 | ||
| 008 | 131021b xxu||||| |||| 00| 0 eng d | ||
| 020 | |a 9783527607594 | ||
| 100 | |a Birkholz, Mario | ||
| 245 | |a Thin film analysis by xray scattering | ||
| 260 | |c 2006 |b Wiley | ||
| 653 | |a Materials Characterization | ||
| 856 | |u http://onlinelibrary.wiley.com/book/10.1002/3527607595 | ||
| 942 | |c EB |6 _ | ||
| 999 | |c 66735 |d 66735 | ||
| 952 | |0 0 |1 0 |2 udc |4 0 |6 _ |7 0 |9 79003 |a UL |b UL |d 2013-05-07 |g 0.00 |p EB000094 |r 2013-05-07 |v 0.00 |w 2013-05-07 |y EB | ||