Cita APA

Birkholz, M. (2006). Thin film analysis by xray scattering. Wiley.

Citación estilo Chicago

Birkholz, Mario. Thin Film Analysis by Xray Scattering. Wiley, 2006.

Cita MLA

Birkholz, Mario. Thin Film Analysis by Xray Scattering. Wiley, 2006.

Warning: These citations may not always be 100% accurate.