Birkholz, M. (2006). Thin film analysis by xray scattering. Wiley.
Chicago Edition CitationBirkholz, Mario. Thin Film Analysis by Xray Scattering. Wiley, 2006.
Deismireacht MLABirkholz, Mario. Thin Film Analysis by Xray Scattering. Wiley, 2006.
Rabhadh: D'fhéadfadh nach mbeadh na deismireachtaí seo 100% cruinn i gcónaí.