APA aipamena

Birkholz, M. (2006). Thin film analysis by xray scattering. Wiley.

Chicago Style aipamena

Birkholz, Mario. Thin Film Analysis by Xray Scattering. Wiley, 2006.

MLA aipamena

Birkholz, Mario. Thin Film Analysis by Xray Scattering. Wiley, 2006.

Kontuz: berrikusi erreferentzia hauek erabili aurretik.