Birkholz, M. (2006). Thin film analysis by xray scattering. Wiley.
Chicago Edition CitationBirkholz, Mario. Thin Film Analysis by Xray Scattering. Wiley, 2006.
Cita MLABirkholz, Mario. Thin Film Analysis by Xray Scattering. Wiley, 2006.
Atenció: Aquestes cites poden no estar 100% correctes.