Robust nanoparametric statistical methods

Bibliographic Details
Main Author: Hettmansperger, Thomas
Other Authors: MC Kean, Joseph W
Format: Printed Book
Language:English
Published: Boca Raton CRC Press 2011
Edition:2nd ed.
Series:Monographs on statistics and applied probability; 119
Subjects:
Nanoparametric statistics
Robust statistics

UL

Holdings details from UL
Call Number: 519.234 HET
Copy Live Status Unavailable

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