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Handbook of instrumentation and techniques for semiconductor nanostructure characterization

書目詳細資料
主要作者: Haight, Richard; ed (ed. by)
其他作者: Ross, Frances M, Hannon, James B
格式: Printed Book
語言:English
出版: Singapore World Scientific publishing 2012
叢編:World scientific series in materials and energy
主題:

UL

持有資料詳情 UL
索引號: 621.382:681.7 HAI.1 R
621.382:681.7 HAI.2 R
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復印件 Live Status Unavailable