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Handbook of instrumentation and techniques for semiconductor nanostructure characterization
主要作者: | |
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其他作者: | , |
格式: | Printed Book |
語言: | English |
出版: |
Singapore
World Scientific publishing
2012
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叢編: | World scientific series in materials and energy
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主題: |
UL
索引號: |
621.382:681.7 HAI.1 R 621.382:681.7 HAI.2 R |
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復印件 | Live Status Unavailable |
復印件 | Live Status Unavailable |