Handbook of instrumentation and techniques for semiconductor nanostructure characterization

Bibliografske podrobnosti
Glavni avtor: Haight, Richard; ed (ed. by)
Drugi avtorji: Ross, Frances M, Hannon, James B
Format: Printed Book
Jezik:English
Izdano: Singapore World Scientific publishing 2012
Serija:World scientific series in materials and energy
Teme:
Semiconductors
Nanostructures - Electronmicroscopy
x-ray diffraction
Scanning microscopy

UL

Podrobnosti zaloge UL
Signatura: 621.382:681.7 HAI.1 R
621.382:681.7 HAI.2 R
Kopija Zaloga ni dosegljiva
Kopija Zaloga ni dosegljiva

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