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Handbook of instrumentation and techniques for semiconductor nanostructure characterization

Bibliografske podrobnosti
Glavni avtor:	Haight, Richard; ed (ed. by)
Drugi avtorji:	Ross, Frances M, Hannon, James B
Format:	Printed Book
Jezik:	English
Izdano:	Singapore World Scientific publishing 2012
Serija:	World scientific series in materials and energy
Teme:	Semiconductors Nanostructures - Electronmicroscopy x-ray diffraction Scanning microscopy

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