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Handbook of instrumentation and techniques for semiconductor nanostructure characterization

Dettagli Bibliografici
Autore principale:	Haight, Richard; ed (ed. by)
Altri autori:	Ross, Frances M, Hannon, James B
Natura:	Printed Book
Lingua:	English
Pubblicazione:	Singapore World Scientific publishing 2012
Serie:	World scientific series in materials and energy
Soggetti:	Semiconductors Nanostructures - Electronmicroscopy x-ray diffraction Scanning microscopy

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