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Handbook of instrumentation and techniques for semiconductor nanostructure characterization

Sonraí Bibleagrafaíochta
Príomhúdar:	Haight, Richard; ed (ed. by)
Údair Eile:	Ross, Frances M, Hannon, James B
Formáid:	Printed Book
Teanga:	English
Foilsithe:	Singapore World Scientific publishing 2012
Sraith:	World scientific series in materials and energy
Ábhair:	Semiconductors Nanostructures - Electronmicroscopy x-ray diffraction Scanning microscopy

Míreanna Comhchosúla

Techniques in microscopy and cell biology
le: Sharma, V K
Foilsithe: (1991)

X-ray diffraction procedures for polycrystalline and amorphous materials
le: Klug, Harold P.
Foilsithe: (1974)

Scanning electron microscopy and x-ray microanalysis analytical chemistry by open learning
le: Lawes, Grahame
Foilsithe: (2008)

SCANNING ELECTRON MICROSCOPY AND X/RAY MICROANALYSIS
le: LAWES GRAHAME
Foilsithe: (2008)

Strain and dislocation gradients from diffraction spatially-resolved local structure and defects
le: Barabash, Rozaliya; ed
Foilsithe: (2014)

Effect of disorder and defects in ion-implanted semiconductors: electrical and physiochemical characterization
Foilsithe: (1997)

X-ray diffraction procedures for polycrystalline and amorphous materials
le: Klug, Harold P.
Foilsithe: (1954)

Elements of x-ray diffraction /
le: Cullity, B. D.
Foilsithe: (1978)

X-ray diffraction: a practical approach
le: Suryanarayana, C
Foilsithe: (1998)

X-ray diffraction: a practical approach
le: Suryanarayana, C
Foilsithe: (1998)

Elements of X-ray diffraction
le: CULLITY.B.D and STOCK S.R
Foilsithe: (2001)

Basic concepts of X-ray diffraction
le: ZOLOTOYABKO,Emil
Foilsithe: (2014)

Elements of X-ray diffraction
le: Cullity, B D; Stock S R
Foilsithe: (2018)

Elements of X-ray diffraction
le: Cullity, B D; Stock S R
Foilsithe: (2018)

Elements of X-ray diffraction
le: Cullity, B D; Stock S R
Foilsithe: (2018)

X-ray diffraction Procedures
le: Klug, Harold P; Alexander, Leroy E
Foilsithe: (1970)

Elements of X-ray diffraction
le: Cullity, B D
Foilsithe: (1978)

Diffraction X-ray optics /
le: Erko, A. I.
Foilsithe: (1996)

X-ray diffraction procedures
le: Klzig, Harold P.
Foilsithe: (1954)

Physics of semiconductor nanostructures
le: Jain, K.P
Foilsithe: (1997)

Semiconductor nanostructures
le: Bimberg, Dieter.,ed
Foilsithe: (2008)

Modern metallographic techniques and their applications
le: Phillips,Victor A
Foilsithe: (1971)

X-ray diffraction /
Foilsithe: (1974)

Multiple diffraction of x-rays in crystals /
le: Chang, Shih-Lin
Foilsithe: (1984)

X-ray diffraction
Foilsithe: (1974)

Elements of X-ray diffraction.
le: Cullity, B. D.
Foilsithe: (1956)

Coherent X-Ray Optics
le: Paganin, David
Foilsithe: (2007)

X-ray diffraction by disordered lamellar structures: theory and applications to microdivided silicates and carbons
le: Drits, Victor A
Foilsithe: (1990)

Basics of X-ray diffraction and its applications /
Foilsithe: (2007)

X-ray diffraction
le: Azaroff, Leonid V, et al
Foilsithe: (1974)

Scanning probe microscopies beyond imaging: manipulation of molecules and nanostructures
le: Samori, Paolo; Editor
Foilsithe: (2006)

Scanning electron microscopy and x-ray microanalysis /
le: Goldstein, Joseph I
Foilsithe: (2018)

X-ray diffraction methods
le: Nziffield, E. W.

Scanning probe microscopy in nanoscience and nanotechnology /
Foilsithe: (2010)

Synthesis crystal growth and characterization
le: Krishanan Lal,Ed
Foilsithe: (1982)

Scanning microscopy for nanotechnology: Techniques and applications
le: Zhou, Weilie, Ed.; Wang, Zhong Lin, Ed
Foilsithe: (2007)

Optics of semiconductors and their nanostructures /
Foilsithe: (2004)

X-ray diffraction by polycrystalline materials /
le: Guinebretiere, Rene
Foilsithe: (2007)

X-ray diffraction by polycrystalline materials /
le: Guinebretiere, Rene
Foilsithe: (2007)

Diffraction of X-rays by chain molecules,
le: Vainshtein, B. K.
Foilsithe: (1966)