Loading...
Handbook of instrumentation and techniques for semiconductor nanostructure characterization
| Hovedforfatter: | Haight, Richard; ed (ed. by) |
|---|---|
| Andre forfattere: | Ross, Frances M, Hannon, James B |
| Format: | Printed Book |
| Sprog: | English |
| Udgivet: |
Singapore
World Scientific publishing
2012
|
| Serier: | World scientific series in materials and energy
|
| Fag: |
Lignende værker
-
Techniques in microscopy and cell biology
af: Sharma, V K
Udgivet: (1991) -
X-ray diffraction procedures for polycrystalline and amorphous materials
af: Klug, Harold P.
Udgivet: (1974) -
Scanning electron microscopy and x-ray microanalysis analytical chemistry by open learning
af: Lawes, Grahame
Udgivet: (2008) -
SCANNING ELECTRON MICROSCOPY AND X/RAY MICROANALYSIS
af: LAWES GRAHAME
Udgivet: (2008) -
Strain and dislocation gradients from diffraction spatially-resolved local structure and defects
af: Barabash, Rozaliya; ed
Udgivet: (2014)