Handbook of instrumentation and techniques for semiconductor nanostructure characterization

Sonraí Bibleagrafaíochta
Príomhúdar: Haight, Richard; ed (ed. by)
Údair Eile: Ross, Frances M, Hannon, James B
Formáid: Printed Book
Teanga:English
Foilsithe: Singapore World Scientific publishing 2012
Sraith:World scientific series in materials and energy
Ábhair:
Semiconductors
Nanostructures - Electronmicroscopy
x-ray diffraction
Scanning microscopy

UL

Sonraí sealbhúcháin ó UL
Gairmuimhir: 621.382:681.7 HAI.1 R
621.382:681.7 HAI.2 R
Cóip Live Status Unavailable
Cóip Live Status Unavailable

Míreanna Comhchosúla