Handbook of instrumentation and techniques for semiconductor nanostructure characterization

Detaylı Bibliyografya
Yazar: Haight, Richard; ed (ed. by)
Diğer Yazarlar: Ross, Frances M, Hannon, James B
Materyal Türü: Printed Book
Dil:English
Baskı/Yayın Bilgisi: Singapore World Scientific publishing 2012
Seri Bilgileri:World scientific series in materials and energy
Konular:
Semiconductors
Nanostructures - Electronmicroscopy
x-ray diffraction
Scanning microscopy
Diğer Bilgiler
Fiziksel Özellikler:2v. 610p.
ISBN:9789814322805

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