Handbook of instrumentation and techniques for semiconductor nanostructure characterization

Detalles Bibliográficos
Autor Principal: Haight, Richard; ed (ed. by)
Outros autores: Ross, Frances M, Hannon, James B
Formato: Printed Book
Idioma:English
Publicado: Singapore World Scientific publishing 2012
Series:World scientific series in materials and energy
Subjects:
Semiconductors
Nanostructures - Electronmicroscopy
x-ray diffraction
Scanning microscopy
Descripción
Descrición Física:2v. 610p.
ISBN:9789814322805

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