Handbook of instrumentation and techniques for semiconductor nanostructure characterization

Détails bibliographiques
Auteur principal: Haight, Richard; ed (ed. by)
Autres auteurs: Ross, Frances M, Hannon, James B
Format: Printed Book
Langue:English
Publié: Singapore World Scientific publishing 2012
Collection:World scientific series in materials and energy
Sujets:
Semiconductors
Nanostructures - Electronmicroscopy
x-ray diffraction
Scanning microscopy
Description
Description matérielle:2v. 610p.
ISBN:9789814322805

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