Haight, R. e., Ross, F. M., & Hannon, J. B. (2012). Handbook of instrumentation and techniques for semiconductor nanostructure characterization. World Scientific publishing.
Chicago-стиль цитированияHaight, Richard; ed, Frances M. Ross, and James B. Hannon. Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization. Singapore: World Scientific publishing, 2012.
MLA-цитированиеHaight, Richard; ed, et al. Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization. World Scientific publishing, 2012.
Предупреждение: эти цитированмия не могут быть всегда правильны на 100%.