In situ characterization of thin film growth

Bibliographic Details
Main Author: Koster, Gertjan (Ed. by)
Other Authors: Rijnders, Guus; ed.by
Format: Printed Book
Language:English
Published: Cambridge Woodhead Publishing 2011
Series:Woodhead publishing in materials
Subjects:
Thin film growth - Electron diffraction techniques
Crystal growth

UL

Holdings details from UL
Call Number: 539.216 KOS
Copy Live Status Unavailable

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