Loading...

Reliability of MEMS:testing of materials and devices

Bibliographic Details
Main Author: Tabata,Osamu (ed.by)
Other Authors: Tsuchiya, Toshiyuki
Format: Printed Book
Language:English
Published: Weinheim Wiley-VCH Verlag GmbH & Co. KGaA 2008
Subjects:
LEADER 00735nam a2200253 a 4500
001 adlib96000001
003 ViArRB
005 20151026132419.0
008 960221s1955 dcuabcdjdbkoqu001 0deng d
020 |a 9783527314942 
022
040 |a Adlib 
082 |a 621.382 
245 |a Reliability of MEMS:testing of materials and devices 
250
260 |a Weinheim  |b Wiley-VCH Verlag GmbH & Co. KGaA  |c 2008 
300 |a xx,303p 
500 |a   
100 |a Tabata,Osamu  |e ed.by 
700 |a Tsuchiya, Toshiyuki 
942 |c BK  |6 _ 
653 |a Microelectromechanical systems-Reliability 
999 |c 48221  |d 48221 
952 |0 0  |1 0  |4 0  |6 621382_TAB  |7 0  |9 60856  |a UL  |b UL  |d 2010-06-16  |o 621.382 TAB  |p 00061906  |r 2010-06-16  |w 2010-06-16  |y BK