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00735nam a2200253 a 4500 |
001 |
adlib96000001 |
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ViArRB |
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20151026132419.0 |
008 |
960221s1955 dcuabcdjdbkoqu001 0deng d |
020 |
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|a 9783527314942
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022 |
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040 |
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|a Adlib
|
082 |
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|a 621.382
|
245 |
|
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|a Reliability of MEMS:testing of materials and devices
|
250 |
|
|
|
260 |
|
|
|a Weinheim
|b Wiley-VCH Verlag GmbH & Co. KGaA
|c 2008
|
300 |
|
|
|a xx,303p
|
500 |
|
|
|a
|
100 |
|
|
|a Tabata,Osamu
|e ed.by
|
700 |
|
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|a Tsuchiya, Toshiyuki
|
942 |
|
|
|c BK
|6 _
|
653 |
|
|
|a Microelectromechanical systems-Reliability
|
999 |
|
|
|c 48221
|d 48221
|
952 |
|
|
|0 0
|1 0
|4 0
|6 621382_TAB
|7 0
|9 60856
|a UL
|b UL
|d 2010-06-16
|o 621.382 TAB
|p 00061906
|r 2010-06-16
|w 2010-06-16
|y BK
|