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Emerging nanotechnologies: test, defect tolerance and reliability
| Egile nagusia: | |
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| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
New York
Springer
2008
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| Gaiak: |
| Alearen deskribapena: | |
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| Deskribapen fisikoa: | xii, 405p. |
| ISBN: | 9780387747460 |