Á lódáil...
Emerging nanotechnologies: test, defect tolerance and reliability
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| Formáid: | Printed Book |
| Teanga: | English |
| Foilsithe: |
New York
Springer
2008
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| Ábhair: |
| Cur Síos ar an Mír: | |
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| Cur Síos Fisiciúil: | xii, 405p. |
| ISBN: | 9780387747460 |