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System-on-chip test architectures: nanometer design for testability
| 主要作者: | Wang, Laung-Terng (ed. by) |
|---|---|
| 其他作者: | Stround, Charles E. Touba, Nur A. |
| 格式: | Printed Book |
| 語言: | English |
| 出版: |
Boston
Morgan Kaufmann
2008
|
| 主題: |
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