System-on-chip test architectures: nanometer design for testability

Detalhes bibliográficos
Autor principal: Wang, Laung-Terng (ed. by)
Outros Autores: Stround, Charles E. Touba, Nur A.
Formato: Printed Book
Idioma:English
Publicado em: Boston Morgan Kaufmann 2008
Assuntos:
Systems on a chip-Testing > Integrated circuits- very large scale integration- Testing

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