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System-on-chip test architectures: nanometer design for testability
| मुख्य लेखक: | Wang, Laung-Terng (ed. by) |
|---|---|
| अन्य लेखक: | Stround, Charles E. Touba, Nur A. |
| स्वरूप: | Printed Book |
| भाषा: | English |
| प्रकाशित: |
Boston
Morgan Kaufmann
2008
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| विषय: |
समान संसाधन
समान संसाधन
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