Á lódáil...
System-on-chip test architectures: nanometer design for testability
| Príomhúdar: | Wang, Laung-Terng (ed. by) |
|---|---|
| Údair Eile: | Stround, Charles E. Touba, Nur A. |
| Formáid: | Printed Book |
| Teanga: | English |
| Foilsithe: |
Boston
Morgan Kaufmann
2008
|
| Ábhair: |
Míreanna Comhchosúla
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