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System-on-chip test architectures: nanometer design for testability
| Auteur principal: | Wang, Laung-Terng (ed. by) |
|---|---|
| Autres auteurs: | Stround, Charles E. Touba, Nur A. |
| Format: | Printed Book |
| Langue: | English |
| Publié: |
Boston
Morgan Kaufmann
2008
|
| Sujets: |
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