Lanean...
System-on-chip test architectures: nanometer design for testability
| Egile nagusia: | Wang, Laung-Terng (ed. by) |
|---|---|
| Beste egile batzuk: | Stround, Charles E. Touba, Nur A. |
| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
Boston
Morgan Kaufmann
2008
|
| Gaiak: |
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